At Phenom-World, we believe breakthroughs happen when complex nano technology is made intuitive, easier to use and brought within reach. As the No. 1 global supplier of desktop scanning electron microscopes (SEM), our aiUmbruch nach Text (Clearfix)m is to make imaging and analysis at the nano scale available to every scientist in every lab.
All Phenom SEM systems give direct access to the high-resolution and high-quality imaging and analysis required in a large variety of applications. The Phenom is the perfect tool when it comes to evaluating samples in a short span of time due to the rapid and non-destructive sample preparation and load mechanism. Phenom is known worldwide for its ease-of-use, speed and reliability.
For FILTECH we would like to highlight the following of our latest products:
- Phenom XL: The desktop SEM for large samples and automation
- FiberMetric: Direct observation and measurement of micro and nano fibers is faster, more efficient and easier than ever before.
- Tensile Sample Holder: Tensile testing is a way of determining how materials will react when they are pulled apart or pushed together.
Please visit stand D18-11.1 for more information or a demo.
- Analytical Instruments
- Nanoparticle Analysis
- Online Particle Analysis
- Particle Measuring Methods
- Particle Shape Analysis
- Particle Size Analysis
- Particle Size Distribution Analysis
- Pore Size Meter
- Powder Classifiers
- Scanning Electron Microscopes
- Surface Analysers
- Chemical Industries
- Electronic, Microelectronic Industry
- Filtration and Separation Industry
- Medical, Health Care Industry
- Mineral / Oil / Gas Production
- Paint, Pigments, Coatings Industry
- Pharmaceutical Industry
- Plastic Industry
- Semiconductor Industry
- Textile Industry
Printed on 2017-12-11